sb_t_stat Struct Reference

Statistics of the elaborations done with the function sb_project_detection . More...

#include <sb.h>

Collaboration diagram for sb_t_stat:

Data Fields
sb_t_par	par
	Project parameters. More...
sb_t_stat_models	models
	Array of the statistics of the models.
sb_t_stat_model	global
	Global statistics.
int	no_good
	Counter of "No Good" images. More...
int	good
	Counter of "Good" images. More...
int	overkill
	Counter of "Overkill" images. More...
int	escape
	Counter of "Escape" images. More...
sb_t_metrics	metrics
	Metrics evaluated on images. More...
long long	time_us
	Total analysis time in microsecond.
long long	time_us_average
	Average analysis time in microsecond.
long long	time_blob_us
	Total blob analysis time in microsecond. This time is included in the time_us.
long long	time_blob_us_average
	Average blob analysis time in microsecond.
long long	time_res_us
	Total sb_project_get_res time in microsecond. This time is included in the time_us.
long long	time_res_us_average
	Average sb_project_get_res time in microsecond.
int	elaborated
	Count of the elaborated images.

Detailed Description

Statistics of the elaborations done with the function sb_project_detection .

Warning

Time statistics values are correct assuming the sb_project_detection function is called and then the sb_project_get_res function is called at most once.

-Retina: the parameter samples should be passed to the function sb_project_detection in order to it may evaluate statistics. -Surface: the parameter roi_defects should be passed to the function sb_project_detection in order to it may evaluate statistics.

See also

sb_project_detection

sb_project_get_stat

Definition at line 12931 of file sb.h.

Field Documentation

escape

int sb_t_stat::escape

Counter of "Escape" images.

They are images where some required defects have not been detected, ie with some FALSE NEGATIVE defects.
It is used only with Surface and Deep Surface projects.

Definition at line 12969 of file sb.h.

good

int sb_t_stat::good

Counter of "Good" images.

They are the images without defects. In this case the sb_t_stat_model::tn field of global data (sb_t_stat::global) and models data (sb_t_stat::models) is set to 1.
It is used only with Surface and Deep Surface projects.

Definition at line 12955 of file sb.h.

metrics

sb_t_metrics sb_t_stat::metrics

Metrics evaluated on images.

Metrics computed on image counters. It is used only with Surface and Deep Surface projects.

Definition at line 12976 of file sb.h.

no_good

int sb_t_stat::no_good

Counter of "No Good" images.

They are the images with defects, ie with some TRUE POSITIVE defects.
It is used only with Surface and Deep Surface projects.

Definition at line 12947 of file sb.h.

overkill

int sb_t_stat::overkill

Counter of "Overkill" images.

They are images with false defects detected, ie with some FALSE POSITIVE defects.
It is used only with Surface and Deep Surface projects.

Definition at line 12962 of file sb.h.

par

sb_t_par sb_t_stat::par

Project parameters.

It is valorized with the parameters saved when the sb_project_detection function was last called before the call to the sb_project_get_stat function.

Definition at line 12938 of file sb.h.

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The documentation for this struct was generated from the following file:

• sb.h